ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

General information

  • Status :  Withdrawn
    Publication date : 2004-09
  • Edition : 1
    Number of pages : 10
  • :
    ISO/TC 202/SC 2
    Electron probe microanalysis
  • 71.040.99
    Other standards related to analytical chemistry

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